Commit Graph
7 Commits
Author SHA1 Message Date
Zbigniew Jędrzejewski-Szmek 482dac9431 test-udev-util: do not pass NULL to printf, style fixes 2022-06-09 13:25:17 +02:00
Jan Janssen c462e63eea test: Use TEST macro in more cases
This converts to TEST macro in less trivial cases. This is mostly
due to having an intro or outro before/after the actual tests.

Some notable changes:
 - add a "test" to make sure the hashmap and ordered_hashmap tests
   from different compilation units are actually run in test-hashmap.c
 - make root arg a global var in test-install-root.c
 - slightly rework an EFI specific test in test-proc-cmdline.c
 - usage of saved_argv/saved_argc in test-process-util.c
 - splitting test-rlimit-util.c into several tests
 - moving the hwdb open check into intro in test-sd-hwdb.c
 - condense several "tests" into one in test-udev-util.c
2021-11-25 15:03:10 +01:00
Lennart Poettering f5e775973a sd-device: use strjoina() more again in sd_device_new_from_subsystem_sysname()
This reverts a major part of: e17c95af8e

Using format strings for concatenating strings is pretty unefficient,
and using PATH_MAX buffers unpretty as well. Let's revert to using
strjoina() as before.

However, to fix the fuzz issue at hand, let's explicitly verify the two
input strings ensuring they are valid path names. This includes a length
check (to 2K each), thus making things prettier, faster and using less
memory again.
2021-05-21 17:52:57 +02:00
Yu Watanabe 1223227f95 udev: move util_resolve_subsys_kernel() to udev-util.c 2020-12-16 02:14:47 +09:00
Yu Watanabe 5953d8b910 udev: move util_replace_whitespace() to udev-util.c 2020-12-16 02:14:47 +09:00
Yu Watanabe db9ecf0501 license: LGPL-2.1+ -> LGPL-2.1-or-later 2020-11-09 13:23:58 +09:00
Yu, Li-Yu 9abfd759d2 udev: test udev_rule_parse_value() 2020-10-29 20:19:29 +08:00