test-journal-append: use DEFINE_MAIN_FUNCTION_WITH_POSITIVE_FAILURE

Negative return values, e.g. from option parsing, were propagated verbatim
as the exit status of main() and truncated to meaningless values (-EINVAL
became 234). The positive-failure variant is needed because the binary may
exit with EXIT_TEST_SKIP.

Also propagate EXIT_TEST_SKIP instead of suppressing it.

src/libsystemd/sd-journal/test-journal-append.c

@@ -9,6 +9,7 @@
 #include "iovec-util.h"
 #include "journal-file-util.h"
 #include "log.h"
+#include "main-func.h"
 #include "mmap-cache.h"
 #include "options.h"
 #include "parse-util.h"
@@ -141,7 +142,7 @@ static int journal_corrupt_and_append(uint64_t start_offset, uint64_t step) {
         return 0;
 }
 
-int main(int argc, char *argv[]) {
+static int run(int argc, char *argv[]) {
         uint64_t start_offset = UINT64_MAX;
         uint64_t iterations = 100;
         uint64_t iteration_step = 1;
@@ -235,12 +236,11 @@ int main(int argc, char *argv[]) {
                         offset = (start_offset == UINT64_MAX ? 0 : start_offset) + i * iteration_step;
 
                 r = journal_corrupt_and_append(offset, corrupt_step);
-                if (r < 0)
-                        return EXIT_FAILURE;
-                if (r > 0)
-                        /* Reached the end of the journal file */
-                        break;
+                if (r != 0)  /* Either error or EXIT_TEST_SKIP */
+                        return r;
         }
 
-        return EXIT_SUCCESS;
+        return 0;
 }
+
+DEFINE_MAIN_FUNCTION_WITH_POSITIVE_FAILURE(run);